Article (2003)
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| Department: | Department of Engineering Physics |
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| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/25392/ |
| Journal Title: | Applied Surface Science (vol. 210, no. 3-4) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0169-4332(03)00104-1 |
| Official URL: | https://doi.org/10.1016/s0169-4332%2803%2900104-1 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:14 |
| Cite in APA 7: | Yang, D.-Q., & Sacher, E. (2003). Local surface cleaning and cluster assembly using contact mode atomic force microscopy. Applied Surface Science, 210(3-4), 158-164. https://doi.org/10.1016/s0169-4332%2803%2900104-1 |
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