M. Ouaddari, S. Delprat, F. Vidal, M. Chaker and Ke Wu
Article (2005)
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| Department: | Department of Electrical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/23809/ |
| Journal Title: | IEEE Transactions on Microwave Theory and Techniques (vol. 53, no. 4) |
| Publisher: | IEEE |
| DOI: | 10.1109/tmtt.2005.845759 |
| Official URL: | https://doi.org/10.1109/tmtt.2005.845759 |
| Date Deposited: | 18 Apr 2023 15:18 |
| Last Modified: | 08 Apr 2025 02:12 |
| Cite in APA 7: | Ouaddari, M., Delprat, S., Vidal, F., Chaker, M., & Wu, K. (2005). Microwave characterization of ferroelectric thin-film material. IEEE Transactions on Microwave Theory and Techniques, 53(4), 1390-1397. https://doi.org/10.1109/tmtt.2005.845759 |
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