A. Martin, Jean-Yves Trépanier, Marcelo Reggio
and X. Y. Guo
Article (2007)
An external link is available for this item| Department: | Department of Mechanical Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/21637/ |
| Journal Title: | Plasma Science & Technology (vol. 9, no. 6) |
| Publisher: | IOP Publishing |
| DOI: | 10.1088/1009-0630/9/6/02 |
| Official URL: | https://doi.org/10.1088/1009-0630/9/6/02 |
| Date Deposited: | 18 Apr 2023 15:17 |
| Last Modified: | 08 Apr 2025 02:09 |
| Cite in APA 7: | Martin, A., Trépanier, J.-Y., Reggio, M., & Guo, X. Y. (2007). Transient Ablation Regime in Circuit Breakers. Plasma Science & Technology, 9(6), 653-656. https://doi.org/10.1088/1009-0630/9/6/02 |
|---|---|
Statistics
Dimensions
