A. Martin, Jean-Yves Trépanier, Marcelo Reggio and X. Y. Guo
Article (2007)
An external link is available for this itemDepartment: | Department of Mechanical Engineering |
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PolyPublie URL: | https://publications.polymtl.ca/21637/ |
Journal Title: | Plasma Science & Technology (vol. 9, no. 6) |
Publisher: | IOP Publishing |
DOI: | 10.1088/1009-0630/9/6/02 |
Official URL: | https://doi.org/10.1088/1009-0630/9/6/02 |
Date Deposited: | 18 Apr 2023 15:17 |
Last Modified: | 25 Sep 2024 16:00 |
Cite in APA 7: | Martin, A., Trépanier, J.-Y., Reggio, M., & Guo, X. Y. (2007). Transient Ablation Regime in Circuit Breakers. Plasma Science & Technology, 9(6), 653-656. https://doi.org/10.1088/1009-0630/9/6/02 |
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