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Dual-band integrated self-biased edge-mode isolator based on the double ferromagnetic resonance of a bistable nanowire substrate

Louis-Philippe Carignan, Christophe Caloz and David Ménard

Paper (2010)

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Department: Department of Electrical Engineering
Department of Engineering Physics
Research Center: CREER - Centre for Research in Radiofrequency Electronics
POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics
RQMP - Regroupement québécois sur les matériaux de pointe
ISBN: 9781424460588
PolyPublie URL: https://publications.polymtl.ca/18537/
Conference Title: IEEE MTT-S International Microwave Symposium (IMS 2010)
Conference Location: Anaheim, CA, United states
Conference Date(s): 2010-05-23 - 2010-05-28
Publisher: IEEE
DOI: 10.1109/mwsym.2010.5517585
Other DOIs related to this document: 10.1109/mwsym.2010.5516248
Official URL: https://doi.org/10.1109/mwsym.2010.5517585
Date Deposited: 18 Apr 2023 15:13
Last Modified: 09 Sep 2025 15:03
Cite in APA 7: Carignan, L.-P., Caloz, C., & Ménard, D. (2010, May). Dual-band integrated self-biased edge-mode isolator based on the double ferromagnetic resonance of a bistable nanowire substrate [Paper]. IEEE MTT-S International Microwave Symposium (IMS 2010), Anaheim, CA, United states. https://doi.org/10.1109/mwsym.2010.5517585

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