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Improving system testability and testing with microarchitectures

Aminata Sabané

Paper (2010)

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Department: Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/17670/
Conference Title: 17th Working Conference on Reverse Engineering (WCRE 2010)
Conference Location: Beverly, Massachusetts, USA
Conference Date(s): 2010-10-13 - 2010-10-16
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/wcre.2010.47
Official URL: https://doi.org/10.1109/wcre.2010.47
Date Deposited: 18 Apr 2023 15:14
Last Modified: 05 May 2023 15:24
Cite in APA 7: Sabané, A. (2010, October). Improving system testability and testing with microarchitectures [Paper]. 17th Working Conference on Reverse Engineering (WCRE 2010), Beverly, Massachusetts, USA. https://doi.org/10.1109/wcre.2010.47

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