Paper (2010)
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| Department: | Department of Computer Engineering and Software Engineering |
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| ISBN: | 9781424489114 |
| PolyPublie URL: | https://publications.polymtl.ca/17670/ |
| Conference Title: | 17th Working Conference on Reverse Engineering (WCRE 2010) |
| Conference Location: | Beverly, Massachusetts, USA |
| Conference Date(s): | 2010-10-13 - 2010-10-16 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/wcre.2010.47 |
| Official URL: | https://doi.org/10.1109/wcre.2010.47 |
| Date Deposited: | 18 Apr 2023 15:14 |
| Last Modified: | 25 Sep 2024 15:55 |
| Cite in APA 7: | Sabané, A. (2010, October). Improving system testability and testing with microarchitectures [Paper]. 17th Working Conference on Reverse Engineering (WCRE 2010), Beverly, Massachusetts, USA. https://doi.org/10.1109/wcre.2010.47 |
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