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Diamant, A., Lucas, T., Rodríguez-Núñez, O., Chae, S., Gros, E., Hahne, C., Maragkou, T., McKinley, R., Schucht, P., & Novikova, T. (janvier 2026). Correction of polarimetric artifacts caused by a plastic cover in imaging Mueller polarimeter operating in reflection mode [Communication écrite]. BiOS, 2026, San Francisco, CA, USA. Lien externe
