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Zeng, M., Mayer, J. R. R., Feng, M., Bitar-Nehme, E., & Truong Duong, X. (2025). Comparison of Two Machine Learning Models for Predicting Volumetric Errors From On-The-Fly R-Test Type Device Data and Virtual End Point Constraints. Journal of Machine Engineering, 25, 5-19. Lien externe
