Comparison of Two Machine Learning Models for Predicting Volumetric Errors From On-The-Fly R-Test Type Device Data and Virtual End Point Constraints

Min Zeng, J. R. René Mayer, Miao Feng, Elie Bitar-Nehme and Xuan Truong Duong

Article (2025)

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Department:	Department of Mechanical Engineering
PolyPublie URL:	https://publications.polymtl.ca/65946/
Journal Title:	Journal of Machine Engineering (vol. 25)
Publisher:	Publishing House of Wrocław Board of Scientific Technical Societies Federation NOT
DOI:	10.36897/jme/203805
Official URL:	https://doi.org/10.36897/jme/203805
Date Deposited:	03 Jun 2025 15:46
Last Modified:	03 Jun 2025 15:46

Cite in APA 7:	Zeng, M., Mayer, J. R. R., Feng, M., Bitar-Nehme, E., & Truong Duong, X. (2025). Comparison of Two Machine Learning Models for Predicting Volumetric Errors From On-The-Fly R-Test Type Device Data and Virtual End Point Constraints. Journal of Machine Engineering, 25, 5-19. https://doi.org/10.36897/jme/203805
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