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Lussier, A. W., Bourbonnais-Sureault, D., Chicoine, M., Martel, R., Martinu, L., Roorda, S., & Schiettekatte, F. (2024). Raman-based mapping and depth-profiling of the relaxation state in amorphous silicon. Journal of Applied Physics, 135(6), 065301 (12 pages). Lien externe
Thériault, P.-L., Malinge, A., Humeniuk, H. V., Bourbonnais-Sureault, D., Juteau, G., Martel, R., Perepichka, D. F., & Kéna-Cohen, S. (2024). Spontaneously-Oriented Evaporated Organic Semiconductor Thin Films for Second-Order Nonlinear Photonics. ACS Photonics. Lien externe
