Documents publiés en "2022"

Département de génie informatique et génie logiciel

Desrosiers, C., Letenneur, M., Bernier, F., Cheriet, F., Brailovski, V., Piché, N., & Guibault, F. (février 2022). Correlative laser confocal microscopy study and multimmodal 2D/3D registration as ground truth for x-ray inspection of internal defects in LPBF manufacturing [Communication écrite]. 11th Conference on Industrial Computed Tomography (ICT 2022), Wels, Austria. Lien externe