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Oukaira, A., Touati, D. E., Hassan, A., Ali, M., Savaria, Y., & Lakhssassi, A. (août 2021). Thermo-mechanical Analysis and Fatigue Life Prediction for Integrated Circuits (ICs) [Communication écrite]. IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2021), Lansing, MI, USA. Lien externe
