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Delbergue, D., Texier, D., Lévesque, M., & Bocher, P. (2019). Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods. Journal of Applied Crystallography, 52(4), 828-843. Lien externe
Tabiai, I., Texier, D., Bocher, P., Therriault, D., & Lévesque, M. (2019). In-situ Full Field Out of Plane Displacement and Strain Measurements at the Micro-Scale in Single Reinforcement Composites under Transverse Load. Experimental Mechanics, 60(3), 359-377. Lien externe
