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Ammar, M., Hamad, G. B., Mohamed, O. A.̈., & Savaria, Y. (2019). System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs). Dans Velazco, R., McMorrow, D., & Estela, J. (édit.), Radiation Effects on Integrated Circuits and Systems for Space Applications (p. 13-38). Lien externe
