Documents publiés en "2018"

B

Berrima, S., Blaquière, Y., & Savaria, Y. (2018). Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integration, 62, 159-169. Lien externe

D

Darvishi, M., Audet, Y., & Blaquière, Y. (2018). Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA. IEEE Transactions on Nuclear Science, 65(5), 1153-1160. Lien externe

L

Lepercq, É., Blaquière, Y., & Savaria, Y. (2018). A pattern-based routing algorithm for a novel electronic system prototyping platform. Integration, 62, 224-237. Lien externe