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Chao, C., Panerati, J., & Beltrame, G. (septembre 2016). Effects of online fault detection mechanisms on Probabilistic Timing Analysis [Communication écrite]. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2016), Connecticut. Lien externe
Panerati, J., Beltrame, G., Schwind, N., Zeltner, S., & Inoue, K. (mars 2016). Probabilistic Resilience in Hidden Markov Models [Communication écrite]. 4th International Conference on Manufacturing, Optimization, Industrial and Material Engineering (MOIME 2016), Bali, Indonesia (10 pages). Lien externe
