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Lakhssassi, A., Palenychka, R., Savaria, Y., Sayde, M., & Zaremba, M. (2016). Monitoring thermal stress in wafer-scale integrated circuits by the attentive vision method using an infrared camera. IEEE Transactions on Circuits and Systems for Video Technology, 26(2), 412-424. Lien externe
Guillemot, M., Nguyen, H., Bougataya, M., Blaquiere, Y., Lakhssassi, A., Shields, M., & Savaria, Y. (2016). Wafer-scale rapid electronic systems prototyping platform: User support tools and thermo-mechanical validation. Dans Novel Advances in Microsystems Technologies and Their Applications (p. 67-100). Lien externe
