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Koelling, S., Plantenga, R. C., Ikaros T. Hauge, H., Ren, Y., Li, A., Verheijen, M. A., Conesa-Boj, S., Assali, S., Koenraad, P. M., & A. M. Bakkers, E. P. (2016). Impurity and Defect Monitoring in Hexagonal Si and SiGe Nanocrystals. ECS Meeting Abstracts, MA2016-02(30), 1949-1949. Lien externe
