Documents publiés en "2016"

Département de génie physique

Koelling, S., Plantenga, R. C., Hauge, H. I. T., Ren, Y., Li, A., Verheijen, M. A., Conesa Boj, S., Assali, S., Koenraad, P. M., & Bakkers, E. P. A. M. (octobre 2016). Impurity and defect monitoring in hexagonal Si and SiGe nanocrystals [Communication écrite]. Symposium on SiGe, Ge, and Related Materials: Materials, Processing, and Devices 7 (PRiME 2016)/230th ECS Meeting, Honolulu, HI. Publié dans ECS Transactions, 75(8). Lien externe

Koelling, S., Plantenga, R. C., Ikaros T. Hauge, H., Ren, Y., Li, A., Verheijen, M. A., Conesa-Boj, S., Assali, S., Koenraad, P. M., & A. M. Bakkers, E. P. (2016). Impurity and Defect Monitoring in Hexagonal Si and SiGe Nanocrystals. ECS Meeting Abstracts, MA2016-02(30), 1949-1949. Lien externe