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Jiudong, W., Emond, N., Hendaoui, A., Delprat, S., Chaker, M., & Wu, K. (juillet 2015). Broadband temperature-dependent dielectric properties of polycrystalline vanadium dioxide thin films [Communication écrite]. IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP 2015), Suzhou, China. Lien externe
