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Laflamme-Mayer, N., Blaquière, Y., & Sawan, M. (2015). A configurable analog buffer dedicated to a wafer-scale prototyping platform. Analog Integrated Circuits and Signal Processing, 82(1), 57-66. Lien externe
Sion, G., Blaquière, Y., & Savaria, Y. (juillet 2015). Defect diagnosis algorithms for a field programmable interconnect network embedded in a very large area integrated circuit [Communication écrite]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece. Lien externe
