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Hobeika, C., Pichette, S., Léonard, M.-A., Thibeault, C., Boland, J.-F., & Audet, Y. (juillet 2014). Multi-abstraction level signature generation and comparison based on radiation single event upset [Communication écrite]. 20th IEEE International On-Line Testing Symposium (IOLTS 2014), Catalunya, Spain. Lien externe
