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Kamrani, E., Lesage, F., & Sawan, M. (2013). Efficient premature edge breakdown prevention technique for SiAPD fabrication using standard CMOS process. IOP International Journal of Semiconductor Science and Technology, 28(4). Lien externe
Chaddad, A., Kamrani, E., Le Lan, J., & Sawan, M. (mai 2013). De-noising fNIRS signals to enhance brain imaging diagonosis [Communication écrite]. 29th Southern Biomedical Engineering Conference (SBEC 2013), Miami, FL, USA. Lien externe