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Girard-Lauriault, P.-L., Ruiz, J.-C., Gross, T., Dietrich, P. M., Wertheimer, M. R., & Unger, W. (septembre 2011). Energy and angle resolved XPS (AR-ERXPS) for ultra-shallow chemical and elemental analysis of thin organic coatings [Communication écrite]. 14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11), Cardiff, Wales, UK. Non disponible
