Pierre-Luc Girard-Lauriault, J.-C. Ruiz, T. Gross, Paul M. Dietrich, Michael R. Wertheimer and Wolfgang Unger
Paper (2011)
This item is not archived in PolyPublieDepartment: | Department of Engineering Physics |
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PolyPublie URL: | https://publications.polymtl.ca/38170/ |
Conference Title: | 14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11) |
Conference Location: | Cardiff, Wales, UK |
Conference Date(s): | 2011-09-04 - 2011-09-09 |
Date Deposited: | 18 Apr 2023 15:12 |
Last Modified: | 25 Sep 2024 16:22 |
Cite in APA 7: | Girard-Lauriault, P.-L., Ruiz, J.-C., Gross, T., Dietrich, P. M., Wertheimer, M. R., & Unger, W. (2011, September). Energy and angle resolved XPS (AR-ERXPS) for ultra-shallow chemical and elemental analysis of thin organic coatings [Paper]. 14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11), Cardiff, Wales, UK. |
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