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Energy and angle resolved XPS (AR-ERXPS) for ultra-shallow chemical and elemental analysis of thin organic coatings

Pierre-Luc Girard-Lauriault, J.-C. Ruiz, T. Gross, Paul M. Dietrich, Michael R. Wertheimer and Wolfgang Unger

Paper (2011)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/38170/
Conference Title: 14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11)
Conference Location: Cardiff, Wales, UK
Conference Date(s): 2011-09-04 - 2011-09-09
Date Deposited: 18 Apr 2023 15:12
Last Modified: 05 Apr 2024 11:32
Cite in APA 7: Girard-Lauriault, P.-L., Ruiz, J.-C., Gross, T., Dietrich, P. M., Wertheimer, M. R., & Unger, W. (2011, September). Energy and angle resolved XPS (AR-ERXPS) for ultra-shallow chemical and elemental analysis of thin organic coatings [Paper]. 14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11), Cardiff, Wales, UK.

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