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Diop, M. D., Radji, M., André, W., Blaquière, Y., Hamoui, A. A., & Izquierdo, R. (octobre 2010). Electrical characterization of annular through silicon vias for a reconfigurable wafer-sized circuit board [Communication écrite]. IEEE 19th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2010, Austin, TX, United states. Lien externe
