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Basile-Bellavance, Y., Blaquiere, Y., & Savaria, Y. (juin 2009). Faults diagnosis methodology for the WaferNet interconnection network [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2009), Toulouse, France. Lien externe
Lepercq, E., Blaquiere, Y., Norman, R., & Savaria, Y. (mai 2009). Workflow for an electronic configurable prototyping system [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2009), Taipei, Taiwan. Lien externe
