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Basile-Bellavance, Y., Blaquiere, Y., & Savaria, Y. (juin 2009). Faults diagnosis methodology for the WaferNet interconnection network [Communication écrite]. Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA 2009), Toulouse, France. Lien externe
Lepercq, E., Valorege, O., Basile-Bellavance, Y., Laflamme-Mayer, N., Blaquière, Y., & Savaria, Y. (octobre 2009). An interconnection network for a novel reconfigurable circuit board [Communication écrite]. 2nd Microsystems and Nanoelectronics Research Conference, Ottawa, Canada. Lien externe