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Lindenberg, A. M., Engemann, S., Gaffney, K. J., Sokolowski-Tinten, K., Larsson, J., Hillyard, P. B., Reis, D. A., Fritz, D. M., Arthur, J., Akre, R. A., George, M. J., Deb, A., Bucksbaum, P. H., Hajdu, J., Meyer, D. A., Nicoul, M., Blome, C., Tschentscher, T., Cavalieri, A. L., ... Hastings, J. B. (2008). X-Ray Diffuse Scattering Measurements of Nucleation Dynamics at Femtosecond Resolution. Physical Review Letters, 100(13). Lien externe
Lindenberg, A. M., Engemann, S., Gaffney, K. J., Sokolowski-Tinten, K., Larsson, J., Reis, D., Lorazo, P., & Hastings, J. B. (avril 2008). Femtosecond x-ray diffuse scattering measurements of semiconductor ablation dynamics [Communication écrite]. High-Power Laser Ablation VII, Taos, NM, United states. Lien externe
