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Beltrame, G., Bolchini, C., Fossati, L., Miele, A., & Sciuto, D. (septembre 2007). A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip [Communication écrite]. 22nd International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), Rome, Italy. Lien externe
