 | Monter d'un niveau |
Bougataya, M., Lakhasasi, A., Savaria, Y., & Massicotte, D. (mai 2004). Thermo-mechanical stress analysis of VLSI devices by partially coupled finite element method [Communication écrite]. 18th Annual Canadian Conference on Electrical and Computer Engineering (CCEC 2004), Niagara Falls, Ontario. Lien externe
