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La Haye, M. L., Chapman, G. H., Jung, C., Cheung, D. Y., Djaja, S., & Audet, Y. (octobre 2004). Characteristics of fault-tolerant photodiode and photogate active pixel sensors (APS) [Communication écrite]. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2004), Cannes, France. Lien externe
