Documents publiés en "2004"

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Özcan, A. S., Ludwig, K., Lavoie, C., Basu, S. N., Coia, C., Cabral, C., Rodbell, K. P., & E. Harper, J. M. (2004). Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001). Thin Solid Films, 466(1-2), 238-249. Lien externe