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Degorce, J.-Y., Saucier, A., & Meunier, M. (juin 2002). A simple analytical method for the characterization of the melt region of a semiconductor under focused laser irradiation [Communication écrite]. European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing, Strasbourg, France. Publié dans Applied Surface Science, 208-209. Lien externe
Saucier, A. Data-Adaptive Orthogonal Wavelet Bases Obtained Via Principal Component Analysis [Communication écrite]. International Conference on Imaging Science, Systems and Technology (CISST 2003). Non disponible
