Items published in "2003"

L

Lu, M., Savaria, Y., Qiu, B., & Taillefer, J. (2003, November). IEEE 1149.1 based defect and fault tolerant scan chain for wafer scale integration [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. External link