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Items published in "2003"

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Nicolescu, B., Perronnard, P., Velazco, R., & Savaria, Y. (2003, November). Efficiency of transient bit-flips detection by software means a complete study [Paper]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Cambridge, MA, USA. External link

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