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Dennler, G., Houdayer, A., Raynaud, P., Ségui, Y., & Wertheimer, M. R. (2002). Capabilities and Limitations of RBS to Characterize Hyper-Thin Silicon Compound Layers on Various Polymeric Substrates. Dans Sacher, E. (édit.), Metallization of Polymers 2 (p. 153-163). Lien externe
Dennler, G., Houdayer, A., Raynaud, P., Ségui, Y., & Wertheimer, M. R. (2002). Characterization by RbS of Hyper-Thin SiO₂ Layers on Various Polymers. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 192(4), 420-428. Lien externe
