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Chen, W. C., Hamel, L. A., Kemp, M., & Yelon, A. (1999). Modelling of Drift Mobility Experiments on a-Si:H. MRS Proceedings, 557, 433-438. Lien externe
Wen, C. C., Hamel, L. A., & Yelon, A. (1999). Multiple-trapping model with field-dependent effects on carrier time of flight in a-Si:H. Journal of Non-Crystalline Solids, 258(1-3), 223-233. Lien externe