Documents publiés en "1998"

Département de génie électrique

Arabi, K., & Kamińska, B. (1998). Design for Testability of Embedded Integrated Operational Amplifiers. IEEE Journal of Solid-State Circuits, 33(4), 573-581. Lien externe

Ehsanian, M., Kamińska, B., & Arabi, K. (1998). New on-Chip Digital Bist for Analog-to-Digital Converters. Microelectronics and reliability, 38(3), 409-420. Lien externe

Département de génie informatique et génie logiciel

Arabi, K., & Kamińska, B. (1998). Design for Testability of Embedded Integrated Operational Amplifiers. IEEE Journal of Solid-State Circuits, 33(4), 573-581. Lien externe

Ehsanian, M., Kamińska, B., & Arabi, K. (1998). New on-Chip Digital Bist for Analog-to-Digital Converters. Microelectronics and reliability, 38(3), 409-420. Lien externe