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Arabi, K., Kaminska, B., & Sawan, M. (1998). On Chip Testing Data Converters Using Static Parameters. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 6(3), 409-419. Lien externe
Ehsanian, M., Kaminska, B., & Arabi, K. (1998). New on-Chip Digital Bist for Analog-to-Digital Converters. Microelectronics and reliability, 38(3), 409-420. Lien externe
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