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Bertrand, N., Drévillon, B., Sapieha, J.-E., & Martinu, L. (avril 1996). In situ IR ellipsometry study of the adhesion and growth of plasma deposited silica thin films on stainless steel substrates [Communication écrite]. 23rd International Conference on Metallurgical Coatings and Thin Films (ICMCTF"96), San Diego, CA, USA. Publié dans Thin solid films, 290-291. Lien externe
