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Blais, C., L'Espérance, G., Baril, E., & Forget, C. (janvier 1995). Estimation of errors resulting from stereological measurements of inclusions characterized by X-ray mapping in SEM [Communication écrite]. Microbeam analysis society 1995, Colorado, USA. Non disponible
Hovington, P., L'Espérance, G., Baril, E., & Rigaud, M. (1995). Monitoring the performance of energy-dispersive spectrometer detectors at low-energy. Journal of scanning microscopy, 17(3), 136-138. Lien externe
