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Xu, Y., Maurin, D., Wu, K., Huyart, B., Klemer, D., & Bosisio, R. (juin 1993). On the Design of New Integrated Microprobes (NIMPs) for Non-Linear On-Wafer Device Characterization [Communication écrite]. 41st ARFTG Conference Digest - Spring 1993, Atlanta, GA, United states. Lien externe
