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Gholinia, A., Curd, M. E., Bousser, É., Taylor, K., Hosman, T., Coyle, S., Shearer, M. H., Hunt, J., & Withers, P. J. (2020). Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST). Ultramicroscopy, 214, UNSP 11298 (13 pages). Lien externe
Liang, H., Panepinto, A., Prince, L., Olivier, M., Cossement, D., Bousser, É., Geng, X., Li, W., Chen, M., Snyders, R., & Thiry, D. (2020). Study of the synthesis of C:H coating by PECVD for protecting Mg-based nano-objects. Plasma Processes and Polymers, 17(11), 9 pages. Lien externe