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Items where Author is "Weihs, Adrien"

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Shams, R., Le, W., Weihs, A., & Kadoury, S. (2021, April). Intensity-Based Wasserstein Distance as a Loss Measure for Unsupervised Deformable Deep Registration [Paper]. 18th IEEE International Symposium on Biomedical Imaging (ISBI 2021), Nice, France. External link

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