 | Up a level |
Collaboration networkThis graph maps the connections between all the collaborators of {}'s publications listed on this page.
Each link represents a collaboration on the same publication. The thickness of the link represents the number of collaborations.
Use the mouse wheel or scroll gestures to zoom into the graph.
You can click on the nodes and links to highlight them and move the nodes by dragging them.
Hold down the "Ctrl" key or the "⌘" key while clicking on the nodes to open the list of this person's publications.
Word cloudA word cloud is a visual representation of the most frequently used words in a text or a set of texts. The words appear in different sizes, with the size of each word being proportional to its frequency of occurrence in the text. The more frequently a word is used, the larger it appears in the word cloud. This technique allows for a quick visualization of the most important themes and concepts in a text.
In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
H. Eliassen, S. N., Friis, J., Ringdalen, I. G., Mousseau, N., Trochet, M., & Li, Y. (2019). Atomistic approach to simulate kink migration and kink-pair formation in silicon: The kinetic activation-relaxation technique. Physical review. B, 100(15), 155305 (11 pages). External link
López, P., Ruiz, D. C., Santos, I., Aboy, M.́., Marqués, L. A., Trochet, M., Mousseau, N., & Pelaz, L. (2017, February). Evaluation of energy barriers for topological transitions of Si self-interstitial clusters by classical molecular dynamics and the kinetic activation-relaxation technique [Paper]. Spanish Conference on Electron Devices (CDE 2017), Barcelona, Spain. External link
Mahmoud, S., Trochet, M., Restrepo, O. A., & Mousseau, N. (2018). Study of point defects diffusion in nickel using kinetic activation-relaxation technique. ACTA Materialia, 144(Supplement), 679-690. External link
Mousseau, N., Brommer, P., Joly, J.-F., Béland, L. K., El-Mellouhi, F., N'tsouaglo, G. K., Restrepo, Ó. A., & Trochet, M. (2015). Following atomistic kinetics on experimental timescales with the kinetic Activation-Relaxation Technique. Computational Materials Science, 100, 111-123. External link
Restrepo, O. A., Mousseau, N., Trochet, M., El-Mellouhi, F., Bouhali, O., & Becquart, C. S. (2018). Carbon diffusion paths and segregation at high-angle tilt grain boundaries in α-Fe studied by using a kinetic activation-relation technique. Physical Review B, 97(5), 054309. External link
Restrepo, Ó. A., Mousseau, N., El-Mellouhi, F., Bouhali, O., Trochet, M., & Becquart, C. S. (2016). Diffusion properties of Fe-C systems studied by using kinetic activation-relaxation technique. Computational Materials Science, 112, Part, 96-106. External link
Trochet, M., Mousseau, N., Béland, L. K., & Henkelman, G. (2020). Off-Lattice Kinetic Monte Carlo Methods. In Handbook of Materials Modeling (pp. 715-743). External link
Trochet, M., Mousseau, N., Béland, L. K., & Henkelman, G. (2019). Off-Lattice Kinetic Monte Carlo Methods. In Handbook of Materials Modeling (pp. 1-29). External link
Trochet, M., Mousseau, N., Béland, L. K., & Henkelman, G. (2018). Off-Lattice Kinetic Monte Carlo Methods. In Handbook of Materials Modeling (pp. 1-29). External link
Trochet, M., Sauvé-Lacoursière, A., & Mousseau, N. (2017). Algorithmic developments of the kinetic activation-relaxation technique: Accessing long-time kinetics of larger and more complex systems. Journal of Chemical Physics, 147(15), 152712. External link
Trochet, M., & Mousseau, N. (2017). Energy landscape and diffusion kinetics of lithiated silicon: A kinetic activation-relaxation technique study. Physical Review B, 96(13), 134118. External link
Trochet, M., Béland, L. K., Brommer, P., Joly, J.-F., & Mousseau, N. (2015). Diffusion of point defects in crystalline silicon using the kinetic activation-relaxation technique method. Physical Review B, 91(22), 224106 (12 pages). External link
