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Documents dont l'auteur est "Texier, Damien"

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Nombre de documents: 3

Article de revue

Delbergue, D., Texier, D., Lévesque, M., & Bocher, P. (2019). Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods. Journal of Applied Crystallography, 52(4), 828-843. Lien externe

Communication écrite

Javadi, H., Jomaa, W., Texier, D., Brochu, M., & Bocher, P. (juillet 2016). Surface roughness effects on the fatigue behavior of as-machined inconel 718 [Communication écrite]. 8th International Conference on Materials Structure and Micromechanics of Fracture (MSMF 2017), Brno, Czech republic. Lien externe

Delbergue, D., Texier, D., Lévesque, M., & Bocher, P. (août 2016). Comparison of two X-ray residual stress measurement methods: sin2 ψ and cos α, through the determination of a martensitic steel X-ray elastic constant [Communication écrite]. 10th International Conference on Residual Stresses (ICRS10), Sydney, Australia (6 pages). Disponible

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