Documents dont l'auteur est "Sheng, S. R."

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Sheng, S. R., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. Lien externe