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Gholinia, A., Curd, M. E., Bousser, É., Taylor, K., Hosman, T., Coyle, S., Shearer, M. H., Hunt, J., & Withers, P. J. (2020). Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST). Ultramicroscopy, 214, UNSP 11298 (13 pages). Lien externe
