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Items where Author is "Pan, Weitao"

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Paper

Pan, W., Washizaki, H., Yoshioka, N., Fukazawa, Y., Khomh, F., & Guéhéneuc, Y.-G. (2023, December). A Machine Learning Based Approach to Detect Machine Learning Design Patterns [Paper]. 30th Asia-Pacific Software Engineering Conference (APSEC 2023), Seoul, Korea, Republic of Seoul. External link

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