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Jay, A., Hémeryck, A., Richard, N., Martin-Samos, L., Raine, M., Roch, A. L., Mousseau, N., Goiffon, V., Paillet, P., Gaillardin, M., & Magnan, P. (2018). Simulation of Single-Particle Displacement Damage in Silicon. Part III: First Principle Characterization of Defect Properties. IEEE Transactions on Nuclear Science, 65(2), 724-731. Lien externe
